Alexander Deublein
Alexander Deublein, M. Sc.
Curriculum vitae
Alexander Deublein graduated with a bachelor’s and master’s degree in Electrical Engineering from FAU Erlangen-Nuremberg in August 2018 and April 2021. Since June 2021, he has been working as a research associate at the Institute for Electronics Engineering, focusing on RF power amplifiers.
Research areas
- RF circuit design
- RF power amplifiers
Awards
- 2023: IEEE MTT-S International Microwave Symposium Student Design Competition First Place Award in the category "High-Efficiency Power Amplifier" (IEEE Microwave Theory & Technology Society (MTT-S))
- 2022: IEEE MTT-S International Microwave Symposium Student Design Competition First Place Award in the category "High-Efficiency Power Amplifier" (IEEE Microwave Theory & Technology Society (MTT-S))
Publications
Drain Voltage Impact on a Doherty Power Amplifier's Optimal Splitting Parameters
2024 IEEE Asia-Pacific Microwave Conference (APMC) (Bali, 17. November 2024 - 20. November 2024)
DOI: 10.1109/apmc60911.2024.10867729
URL: https://ieeexplore.ieee.org/document/10867729
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General Combiner Initialization Workflow for All Types of Active Load Modulation Power Amplifiers
2024 15th German Microwave Conference (GeMiC) (Duisburg, 11. March 2024 - 13. March 2024)
DOI: 10.23919/gemic59120.2024.10485318
URL: https://ieeexplore.ieee.org/document/10485318
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A Linearized Calibration Technique Using Modulated Signals for Wideband Dual-Input Doherty Characterization
2024 IEEE Topical Conference on RF/Microwave Power Amplifiers for Radio and Wireless Applications (PAWR) (San Antonio, Texas, 21. January 2024 - 24. January 2024)
DOI: 10.1109/PAWR59907.2024.10438601
URL: https://ieeexplore.ieee.org/document/10438601
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Advanced PA Concepts and Technology for 5G/6G Power Amplifier Applications
Berlin 6G Conference 2024 (bcc Berlin Congress Center GmbH Alexanderstr. 11 10178 Berlin, 2. July 2024 - 4. July 2024)
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Doherty's Dominance Continued: A Linear PA Using GaN-on-Si
In: IEEE Microwave Magazine 24 (2023), p. 65 - 74
ISSN: 1527-3342
DOI: 10.1109/MMM.2022.3226547
URL: https://ieeexplore.ieee.org/document/10035812
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